Issn 2348-375x Genetic Algorithm Based Test Pattern Generation for Asynchronous Circuits with Handshake Controllers

This paper is aimed at generation of automated test pattern for asynchronous circuits based on genetic algorithm. Asynchronous circuits without global clocks are hard to test due to the lack of testing techniques. The testing of asynchronous design involves basic element like C-element, completion detector in handshake controller and logic design. The main contribution is to generate optimized test vector using genetic algorithm for complex asynchronous sequential circuits based on fault simulation. The proposed system based on genetic algorithm is effective in terms of result quality and CPU time requirements. Any stuck-at-fault in the circuit maybe caused due to errors in controller circuit or change in the logic behaviour. To overcome the challenges in the creating test vectors genetic algorithm uses fault simulation process for effective pattern based on the fitness function. Experimental analysis shows that generation of optimal test patterns result with good fault coverage, without the consideration of other methods for increasing the testability.